STRUCTURAL EVALUATION OF EPITAXIALLY GROWN ORGANIC EVAPORATED-FILMS BY TOTAL-REFLECTION X-RAY DIFFRACTOMETER

被引：37

作者：

ISHIDA, K

HAYASHI, K

YOSHIDA, Y

HORIUCHI, T

MATSUSHIGE, K

机构：

[1] Department of Applied Science, Faculty of Engineering, Kyushu University, Higashi-ku

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 11期

关键词：

D O I：

10.1063/1.354024

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An in-plane-type total reflection x-ray diffractometer was newly constructed, and the epitaxial growth of paraffin molecules (n-C33H68) vacuum-evaporated onto a KCl (001) surface was investigated. The molecular chains in as-evaporated films were shown to arrange themselves parallel to the [110] direction of the KCl substrate. After the evaporation, moreover, some molecules were revealed to reorient and tend to deviate their c axis by about +/- 5-degrees from the [110] direction of the KCl crystal, probably because of the lattice mismatchings between the paraffin and substrate crystals.

引用

页码：7338 / 7343

页数：6

共 23 条

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