MICROPROCESSOR FAILURE RATE PREDICTIONS

被引：4
|
作者：
HALIL, B
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1978年 / 17卷 / 01期
关键词：
D O I：
10.1016/0026-2714(78)91156-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：211 / 221
页数：11
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