共 50 条
[45]
APPLICATION OF AES TO STUDY OF SELECTIVE SPUTTERING OF THIN-FILMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1976, 13 (01)
:224-227
[46]
MAGNETIC DEPTH PROFILES IN STRAINED NICKEL-IRON THIN FILMS MEASURED BY POLARIZED NEUTRON REFLECTOMETRY.
[J].
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,
1996, 52
:C464-C464
[49]
New possibilities of polarised neutron reflectometry in the study of domain structure of thin magnetic films
[J].
PHYSICA B,
1997, 234
:519-521