APPLICATION OF THE GRAZING ANGLE POLARIZED NEUTRON REFLECTOMETRY TO STUDY THE MAGNETISM IN THIN-FILMS AND STRATIFIED MEDIA

被引:0
作者
MAAZA, M
机构
来源
JOURNAL DE PHYSIQUE IV | 1992年 / 2卷 / C3期
关键词
D O I
10.1051/jp4:1992325
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
From optical point of view and due to the magnetic interaction of the cold neutrons with the unpaired electron shell, magnetic materials have a neutron spin-dependent refractive index n+ [spin up] and n- [spin down]. Magnetic media such as Fe, Co and Ni react like birefringent uniaxial crystals in ordinary optics. n+ and n- are the equivalent of the ordinary and extraordinary refractive indices. The specular reflection of spin polarized neutrons which is due to the discontinuity of the magnetic induction at the surface of the ferromagnet is a sensitive probe of surface and interface magnetism. We shall first give the background of the art of polarized neutron optics. Secondly, some recent examples from surface and interface magnetism will be given to illustrate the power of this technique such as the magnetic coupling in thin films and multilayers and flux penetration in superconductors.
引用
收藏
页码:177 / 183
页数:7
相关论文
共 50 条
[41]   RADIATIVE DEFECTS STRUCTURE IN HTSC THIN-FILMS - POLARIZED XAS STUDY [J].
MENUSHENKOV, AP ;
IGNATOV, AY ;
CHERNOV, VA ;
NIKITENKO, SG .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 97 (1-4) :151-154
[42]   SIMPLE METHOD OF SPECTROSCOPIC REFLECTOMETRY FOR THE COMPLETE OPTICAL ANALYSIS OF WEAKLY ABSORBING THIN-FILMS - APPLICATION TO SILICON FILMS [J].
OHLIDAL, I ;
NAVRATIL, K .
THIN SOLID FILMS, 1988, 156 (02) :181-189
[43]   APPLICATION OF ELECTROLESS COBALT ALLOY THIN-FILMS TO PERPENDICULAR RECORDING MEDIA [J].
OSAKA, T ;
KOIWA, I ;
GOTO, F ;
SUGANUMA, Y .
NIPPON KAGAKU KAISHI, 1983, (06) :791-797
[44]   ELECTROOPTIC COEFFICIENT DETERMINATION IN STRATIFIED ORGANIZED MOLECULAR THIN-FILMS - APPLICATION TO POLED POLYMERS [J].
CHOLLET, PA ;
GADRET, G ;
KAJZAR, F ;
RAIMOND, P .
THIN SOLID FILMS, 1994, 242 (1-2) :132-138
[45]   APPLICATION OF AES TO STUDY OF SELECTIVE SPUTTERING OF THIN-FILMS [J].
VANOOSTROM, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :224-227
[46]   MAGNETIC DEPTH PROFILES IN STRAINED NICKEL-IRON THIN FILMS MEASURED BY POLARIZED NEUTRON REFLECTOMETRY. [J].
Ott, F. ;
Fermon, C. .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 :C464-C464
[47]   The application of neutron reflectometry and atomic force microscopy in the study of corrosion inhibitor films [J].
John, Douglas ;
Blom, Annabelle ;
Bailey, Stuart ;
Nelson, Andrew ;
Schulz, Jamie ;
De Marco, Roland ;
Kinsella, Brian .
PHYSICA B-CONDENSED MATTER, 2006, 385-86 :924-926
[48]   APPLICATION OF NEUTRON-DIFFRACTION TO THE STUDY OF INTERFACE MAGNETIZATION ON THIN-FILMS WITH ARTIFICIAL SUPER-LATTICES [J].
ENDOH, Y ;
HOSOITO, N ;
SHINJO, T .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1983, 35 (1-3) :93-98
[49]   New possibilities of polarised neutron reflectometry in the study of domain structure of thin magnetic films [J].
Pusenkov, VM ;
Pleshanov, NK ;
Syromyatnikov, VG ;
Ulyanov, VA ;
Schebetov, AF .
PHYSICA B, 1997, 234 :519-521
[50]   Using Grazing-Incidence Small-Angle Neutron Scattering to Study the Orientation of Block Copolymer Morphologies in Thin Films [J].
Hu, Mingqiu ;
Li, Xindi ;
Heller, William T. ;
Bras, Wim ;
Rzayev, Javid ;
Russell, Thomas P. .
MACROMOLECULES, 2023, 56 (06) :2418-2428