USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES

被引:131
作者
PALMBERG, PW
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 01期
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D O I
10.1116/1.1316542
中图分类号
O59 [应用物理学];
学科分类号
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页码:160 / &
相关论文
共 5 条
[1]   AUGER ELECTRON SPECTROSCOPY [J].
CHANG, CC .
SURFACE SCIENCE, 1971, 25 (01) :53-+
[2]   HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER [J].
PALMBERG, PW ;
BOHN, GK ;
TRACY, JC .
APPLIED PHYSICS LETTERS, 1969, 15 (08) :254-&
[3]   AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J].
PALMBERG, PW ;
RHODIN, TN .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2425-&
[4]  
TARNG ML, UNPUBLISHED RESULTS
[5]  
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