THEORETICAL AND EXPERIMENTAL-ANALYSIS OF THE SWITCHING MECHANISM IN HETEROSTRUCTURE HOT-ELECTRON DIODES

被引：25

作者：

HIGMAN, TK ^{[1
]}

HIGMAN, JM ^{[1
]}

EMANUEL, MA ^{[1
]}

HESS, K ^{[1
]}

COLEMAN, JJ ^{[1
]}

机构：

[1] UNIV ILLINOIS,CTR CMPD SEMICOND MICROELECTR,URBANA,IL 61801

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 04期

关键词：

D O I：

10.1063/1.339630

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1495 / 1499

页数：5

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