HIGH-BRIGHTNESS PROTON-BEAMS AT THE NAC NUCLEAR MICROPROBE BY ACCELERATION OF H-2 IONS

被引:27
作者
TAPPER, UAS [1 ]
MCMURRAY, WR [1 ]
ACKERMANN, GF [1 ]
CHURMS, C [1 ]
DEVILLIERS, G [1 ]
FOURIE, D [1 ]
GROENEWALD, PJ [1 ]
KRITZINGER, J [1 ]
PINEDA, CA [1 ]
PILCHER, J [1 ]
SCHMITT, H [1 ]
SPRINGHORN, K [1 ]
SWART, T [1 ]
机构
[1] NATL ACCELERATOR CTR,FAURE 7131,SOUTH AFRICA
关键词
D O I
10.1016/0168-583X(93)95516-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The advantage of using the H-2 part of the beam for the acceleration of hydrogen ions is demonstrated. An order of magnitude improvement in beam brightness is measured for two ion sources: a duoplasmatron and a Penning source. The high-momentum beams require the microbeam lenses to be used with high focussing power. Therefore, the performance of the microprobe lenses when operating at their maximum strength has been investigated. The spatial resolution in the microprobe improved significantly when using the high-intensity H-2 beam; the current limitation being the beam stability.
引用
收藏
页码:17 / 24
页数:8
相关论文
共 7 条
[1]  
BROWN KL, 1980, CERN8004 REP
[2]   A VAX AND PC-BASED DATA ACQUISITION-SYSTEM FOR MCA, SCANNING AND LIST-MODE ANALYSIS [J].
CHURMS, CL ;
PILCHER, JV ;
SPRINGHORN, KA ;
TAPPER, UAS .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 77 (1-4) :56-61
[3]   ELECTRON AND ION-BEAM-INDUCED CURRENT IN MOS IC ANALYSIS [J].
GANCHEVA, VF ;
TAPPER, UAS ;
CHURMS, CL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 77 (1-4) :339-343
[4]   THE OXFORD SUBMICRON NUCLEAR MICROSCOPY FACILITY [J].
GRIME, GW ;
DAWSON, M ;
MARSH, M ;
MCARTHUR, IC ;
WATT, F .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 54 (1-3) :52-63
[5]   MULTIPOLE LENSES AND THEIR APPLICATION IN NUCLEAR MICROPROBE LENS SYSTEMS [J].
JAMIESON, DN ;
LEGGE, GJF .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 30 (03) :235-241
[6]   IDENTIFICATION AND ELIMINATION OF INTERNAL AND EXTERNAL PARASITIC MULTIPOLE COMPONENTS IN NUCLEAR MICROPROBE LENS SYSTEMS [J].
TAPPER, UAS ;
JAMIESON, DN ;
SWIETLICKI, E ;
LOVESTAM, NEG ;
HANSSON, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 62 (01) :155-161
[7]   ACHROMATIC FOCUSING FOR PROBEFORMING OF HIGH-RESOLUTION MICROBEAMS [J].
TAPPER, UAS .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 56-7 :712-716