INSTRUMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY AND SECONDARY ION IMAGING MASS-SPECTROMETRY

被引：20

作者：

WERNER, HW ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

关键词：

D O I：

10.1016/0042-207X(72)90037-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：613 / 617

页数：5

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