HIGH SPATIAL-RESOLUTION EELS, THE PROBLEM OF QUANTIFICATION IN THE PRESENCE OF RADIATION-DAMAGE

被引：0
|
作者：
CRAVEN, AJ
CLUCKIE, MM
DUCKWORTH, SP
BAKER, TN
机构：
来源：
EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY | 1988年 / 93卷
关键词：
D O I：
暂无
中图分类号：
Q81 [生物工程学（生物技术）]; Q93 [微生物学];
学科分类号：
071005 ; 0836 ; 090102 ; 100705 ;
摘要：
引用
收藏
页码：179 / 180
页数：2
相关论文
共 50 条
  • [1] HIGH SPATIAL-RESOLUTION EELS, THE PROBLEM OF QUANTIFICATION IN THE PRESENCE OF RADIATION-DAMAGE
    CRAVEN, AJ
    CLUCKIE, MM
    DUCKWORTH, SP
    BAKER, TN
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 179 - 180
  • [2] COMPARISON OF HIGH SPATIAL-RESOLUTION IN EDX AND EELS ANALYSIS
    TITCHMARSH, JM
    ULTRAMICROSCOPY, 1989, 28 (1-4) : 347 - 351
  • [3] HIGH SPATIAL-RESOLUTION SCINTILLATOR FOR PARALLEL DETECTION EELS IN UHVEM
    YOSHIDA, K
    TAKAOKA, A
    URA, K
    FUJITA, H
    KATSUTA, T
    MATSUI, I
    KUBOZOE, M
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 318 - 318
  • [4] HIGH SPATIAL-RESOLUTION ANALYSIS USING PARALLEL DETECTION EELS
    DISKO, MM
    SHUMAN, H
    ULTRAMICROSCOPY, 1986, 20 (1-2) : 43 - 44
  • [5] STUDY OF RADIATION-DAMAGE BY PARALLEL EELS
    KURATA, H
    ISHIZUKA, K
    KOBAYASHI, T
    UYEDA, N
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (05): : 260 - 260
  • [6] EXPERIMENTAL INVESTIGATION OF THE ULTIMATE EELS SPATIAL-RESOLUTION
    MORY, C
    KOHL, H
    TENCE, M
    COLLIEX, C
    ULTRAMICROSCOPY, 1991, 37 (1-4) : 191 - 201
  • [7] SPATIAL-RESOLUTION IN SELECTED-AREA EELS
    SCHENNER, M
    SCHATTSCHNEIDER, P
    ULTRAMICROSCOPY, 1994, 55 (01) : 31 - 41
  • [8] HIGH SPATIAL-RESOLUTION CHEMICAL MICROANALYSIS IN DAMAGE STUDIES
    JOY, DC
    JOURNAL OF METALS, 1979, 31 (12): : 135 - 135
  • [9] HIGH SPATIAL-RESOLUTION MICROANALYSIS OF ELECTRONIC MATERIALS USING EELS AND EDS IN THE STEM
    LONG, NJ
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 59 - 67
  • [10] HIGH SPATIAL-RESOLUTION MICROANALYSIS OF ELECTRONIC MATERIALS USING EDS AND EELS IN THE STEM
    LONG, NJ
    GLAISHER, RW
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 277 - 280
12345