DEMONSTRATION OF CHARGE STORAGE IN DIODES AND MEASUREMENT OF MINORITY CARRIER RECOMBINATION LIFETIME

被引：1

作者：

HAMPSHIRE, MJ

机构：

来源：

INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION | 1971年 / 9卷 / 02期

关键词：

D O I：

10.1177/002072097100900206

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

引用

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页码：110 / +

页数：1

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[1] SWITCHING TIME IN JUNCTION DIODES AND JUNCTION TRANSISTORS
KINGSTON, RH
[J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (05): : 829 - 834
[2] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES
LEDERHANDLER, SR
GIACOLETTO, LJ
[J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04): : 477 - 483