CHARGING EFFECTS IN THE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF TARGETS CONTAINING LOW-CONDUCTIVITY REGIONS

被引：38
作者：
REUTER, W
YU, ML
FRISCH, MA
SMALL, MB
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 02期
关键词：
D O I：
10.1063/1.327657
中图分类号：
O59 [应用物理学];
学科分类号：
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页码：850 / 855
页数：6
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