SHRINKAGE TESTIMATORS FOR THE SCALE PARAMETER OF AN EXPONENTIAL-DISTRIBUTION AT SINGLE AND 2 STAGE

被引：0

作者：

PANDEY, BN ^{[1
]}

MALIK, HJ ^{[1
]}

机构：

[1] UNIV GUELPH,GUELPH N1G 2W1,ONTARIO,CANADA

来源：

MICROELECTRONICS AND RELIABILITY | 1989年 / 29卷 / 06期

关键词：

D O I：

10.1016/0026-2714(89)90018-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：947 / 954

页数：8

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