INFRARED REFLECTANCE AND ELLIPSOMETRIC STUDIES OF GAAS/ALAS SUPERLATTICES

被引：12
作者：
JAHNE, E
ROSELER, A
PLOOG, K
机构：
[1] ACAD SCI GDR,ZENT INST OPT & SPEKT,O-1199 BERLIN,GERMANY
[2] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART 80,GERMANY
来源：
SUPERLATTICES AND MICROSTRUCTURES | 1991年 / 9卷 / 02期
关键词：
D O I：
10.1016/0749-6036(91)90285-Y
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
GaAs-AlAs superlattices were optically characterized by far-infrared reflection spectroscopy and for the first time far-infrared variable angle spectroscopic ellipsometry. The reflectance and ellipsometric spectra are in good agreement with those calculated from the bulk dielectric functions and effective-medium approximation. The AlAs to phonon mode damping turns out to be smaller than previously reported. In the spectra of the ellipsometric parameters features appear at the LO phonon frequencies of both GaAs and AlAs. © 1991.
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页码：219 / 222
页数：4
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