CHARACTERIZATION OF LAYERED SYNTHETIC MICROSTRUCTURE BY TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION

被引：34
作者：
LEPETRE, Y
RASIGNI, G
机构：
来源：
OPTICS LETTERS | 1984年 / 9卷 / 10期
关键词：
D O I：
10.1364/OL.9.000433
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：433 / 434
页数：2
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