REDUCTION OF CONTAMINATION IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY

被引：0

|

作者：

HANAI, T ^{[1
]}

SUZUKI, T ^{[1
]}

HIBINO, M ^{[1
]}

机构：

[1] NAGOYA UNIV,SCH ENGN,DEPT ELECTR,CHIKUSA KU,NAGOYA 46401,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 04期

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中图分类号：

TH742 [显微镜];

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页码：275 / 275

页数：1

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