TIME-RESOLVED REFLECTIVITY MEASUREMENTS OF FEMTOSECOND-OPTICAL-PULSE INDUCED PHASE-TRANSITIONS IN SILICON

被引：487

作者：

SHANK, CV

YEN, R

HIRLIMANN, C

机构：

来源：

PHYSICAL REVIEW LETTERS | 1983年 / 50卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.50.454

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：454 / 457

页数：4

共 14 条

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[6]

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[8]

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[9]

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[10] NONTHERMAL PULSED LASER ANNEALING OF SI - PLASMA ANNEALING [J].

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