MICROSTRUCTURAL CHARACTERIZATION OF FE-AL THIN-FILMS

被引:2
作者
BONETTI, E
ENZO, S
SBERVEGLIERI, G
VALDRE, G
GROPPELLI, S
机构
[1] CONSORZIO INTERUNIV NAZL FIS MAT,DIPARTIMENTO CHIM FIS,I-30123 VENICE,ITALY
[2] CONSORZIO INTERUNIV NAZL FIS MAT,DIPARTIMENTO AUTOMAZ IND,I-25060 BRESCIA,ITALY
[3] CONSORZIO INTERUNIV NAZL FIS MAT,DIPARTIMENTO FIS,I-40126 BOLOGNA,ITALY
[4] CONSORZIO INTERUNIV NAZL FIS MAT,DIPARTIMENTO SCI MINERAL,I-40126 BOLOGNA,ITALY
关键词
D O I
10.1016/0040-6090(91)90076-A
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The structural properties of thermally evaporated Al-Fe layers were studied as a function of the aluminium layer thickness delta-Al (taking values of 1, 2 and 4 nm), with an iron layer of constant thickness, delta-Fe = 30 nm. The quality and orientation of the material were examined by X-ray diffraction and transmission electron microscopy. Crystallites of alpha-Fe oriented in the (110) direction were around 7-8 nm in size for any value of delta-Al except near delta-Al = 1 nm where a mostly amorphous iron layer was obtained. It was also verified that a bilayer of composition delta-Al = 2 nm and delta-Fe = 30 nm, twice repeated, led to a two-phase metal system consisting of an amorphous component and crystalline alpha-Fe type material texturized along the (110) direction. The Fe3Al phase was also detected in the bilayer structure with delta-Al = 4 nm.
引用
收藏
页码:377 / 384
页数:8
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