共 9 条
[1]
STRESS-INDUCED SHIFTS OF FIRST-ORDER RAMAN FREQUENCIES OF DIAMOND AND ZINC-BLENDE-TYPE SEMICONDUCTORS
[J].
PHYSICAL REVIEW B-SOLID STATE,
1972, 5 (02)
:580-+
[2]
THE RAMAN MICROPROBE - A QUANTITATIVE ANALYTICAL TOOL TO CHARACTERIZE LASER-PROCESSED SEMICONDUCTORS
[J].
IEEE CIRCUITS & DEVICES,
1986, 2 (01)
:37-42
[3]
RAMAN-SCATTERING FROM HYDROGENATED MICROCRYSTALLINE AND AMORPHOUS-SILICON
[J].
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS,
1982, 15 (02)
:377-392
[4]
EFFECT OF DIMENSIONS ON THE VIBRATIONAL FREQUENCIES OF THIN SLABS OF SILICON
[J].
PHYSICAL REVIEW B,
1980, 21 (04)
:1543-1548
[5]
MURPHY DV, 1983, MATER RES SOC S P, V17, P81
[7]
Pollak F.H., 1983, SPIE P, V452, P26