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PARA-CHANNEL MODULATION-DOPED FIELD-EFFECT TRANSISTORS BASED ON ALSB0.9AS0.1/GASB
被引:22
|
作者
:
LUO, LF
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Columbia University, New York
LUO, LF
LONGENBACH, KF
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Columbia University, New York
LONGENBACH, KF
WANG, WI
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Columbia University, New York
WANG, WI
机构
:
[1]
Department of Electrical Engineering, Columbia University, New York
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1990年
/ 11卷
/ 12期
关键词
:
D O I
:
10.1109/55.63042
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
We report the successful operation of the first AlSbAs/ GaSb p-channel modulation-doped field-effect transistor. Devices with 1-μm gate length exhibit transconductances of 30 and 110 mS/mm at room temperature and 80 K, with respective maximum drain current densities of 25 and 80 mA/mm. The low field Hall mobility and sheet carrier density of this modulation doped structure are 260 cm2/V. s and 1.8 x 1012 cm-2 at room temperature and 1700 cm2/V. s and 1.4 x 1012 cm-2 at 77 K. Calculations based on these results indicate that room-temperature transconductances of 200 mS/mm or greater could be achieved. This device can be integrated with an InAs n-channel HFET for complementary circuit applications. © 1990 IEEE
引用
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页码:567 / 569
页数:3
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