STRUCTURE AND TEMPERATURE-COEFFICIENT OF ELECTRICAL-RESISTANCE OF FLASH EVAPORATED CRNI THIN-FILMS

被引：0

作者：

RAU, SA ^{[1
]}

BIRJEGA, MI ^{[1
]}

POPESCUPOGRION, N ^{[1
]}

SARBU, C ^{[1
]}

机构：

[1] INST ATOM PHYS,POB 5206,BUCHAREST,ROMANIA

来源：

REVUE ROUMAINE DE PHYSIQUE | 1975年 / 20卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：315 / 317

页数：3

共 17 条

[1]

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[2] ANOMALIES IN ELECTRICAL-RESISTANCE OF THIN NICR FILMS IN TEMPERATURE-RANGE +25 DEGREES TO +80 DEGREES C [J].

BIRJEGA, MI ;

RAU, S .

THIN SOLID FILMS, 1974, 21 (01) :S15-S18

[3] TEMPERATURE-DEPENDENCE OF ELECTRICAL-RESISTANCE OF THIN NICR FILMS BETWEEN 100 DEGREES AND 300 DEGREES K [J].

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THIN SOLID FILMS, 1974, 21 (01) :S11-S14

[4]

BIRJEGA MI, 1973, REV ROUM PHYS, V18, P211

[5] EFFECT OF COMPOSITION ON TEMPERATURE COEFFICIENT OF RESISTANCE OF NICR FILMS [J].

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HENDRY, B .

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[6] METASTABLE THIN FILM EPITAXIAL STRUCTURES [J].

CHOPRA, KL .

PHYSICA STATUS SOLIDI, 1969, 32 (02) :489-&

[7]

Hansen M., 1958, CONSTITUTION BINARY, P541

[8]

HIEBER K, 1973, THIN SOLID FILMS, V20, P63

[9] A NEW MODIFICATION OF CHROMIUM [J].

KIMOTO, K ;

NISHIDA, I ;

UYEDA, R .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (10) :1963-&

[10] AN ELECTRON DIFFRACTION STUDY ON CRYSTAL STRUCTURE OF A NEW MODIFICATION OF CHROMIUM [J].

KIMOTO, K ;

NISHIDA, I .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 22 (03) :744-&

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