HIGH-ORDER MULTIPLE-SCATTERING CALCULATIONS OF X-RAY-ABSORPTION FINE-STRUCTURE

被引:1253
作者
REHR, JJ [1 ]
ALBERS, RC [1 ]
ZABINSKY, SI [1 ]
机构
[1] LOS ALAMOS NATL LAB,DIV THEORET,LOS ALAMOS,NM 87544
关键词
D O I
10.1103/PhysRevLett.69.3397
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
High-order scattering is found to be essential for the convergence of the multiple-scattering (MS) theory of x-ray-absorption fine structure, both in the near-edge and the extended regimes. These contributions are calculated using an ab initio curved-wave scattering-matrix formalism. Convergence to full MS accuracy is demonstrated for fcc Cu, as well as for molecular O2 and N2, where our approach provides a high-order MS interpretation of the sigma* shape resonances.
引用
收藏
页码:3397 / 3400
页数:4
相关论文
共 32 条
[11]  
GURMAN SJ, 1986, J PHYS C SOLID STATE, V19, P1845, DOI 10.1088/0022-3719/19/11/021
[12]  
KONINGSBERGER DC, 1988, PRINCIPLES APPLICATI
[13]   THEORY OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE [J].
LEE, PA ;
PENDRY, JB .
PHYSICAL REVIEW B, 1975, 11 (08) :2795-2811
[14]   X-RAY ABSORPTION-SPECTRA - K-EDGES OF 3D TRANSITION-METALS, L-EDGES OF 3D AND 4D METALS, AND M-EDGES OF PALLADIUM [J].
MULLER, JE ;
JEPSEN, O ;
WILKINS, JW .
SOLID STATE COMMUNICATIONS, 1982, 42 (05) :365-368
[15]   SINGLE-SCATTERING THEORY OF X-RAY ABSORPTION [J].
MULLER, JE ;
SCHAICH, WL .
PHYSICAL REVIEW B, 1983, 27 (10) :6489-6492
[16]   ANALYSIS OF EXPERIMENTAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) DATA USING CALCULATED CURVED-WAVE, MULTIPLE-SCATTERING EXAFS SPECTRA [J].
MUSTRE, J ;
YACOBY, Y ;
STERN, EA ;
REHR, JJ .
PHYSICAL REVIEW B, 1990, 42 (17) :10843-10851
[17]  
Natoli C. R., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P43
[18]   USE OF GENERAL POTENTIALS IN MULTIPLE-SCATTERING THEORY [J].
NATOLI, CR ;
BENFATTO, M ;
DONIACH, S .
PHYSICAL REVIEW A, 1986, 34 (06) :4682-4694
[19]   RANGE OF EXCITED ELECTRONS IN METALS [J].
QUINN, JJ .
PHYSICAL REVIEW, 1962, 1 (04) :1453-+
[20]   THEORETICAL X-RAY ABSORPTION FINE-STRUCTURE STANDARDS [J].
REHR, JJ ;
DELEON, JM ;
ZABINSKY, SI ;
ALBERS, RC .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1991, 113 (14) :5135-5140