CRYSTAL REGULARITY WITH HIGH-RESOLUTION SYNCHROTRON X-RADIATION DIFFRACTION IMAGING

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作者：
STEINER, B
DOBBYN, RC
机构：
来源：
AMERICAN CERAMIC SOCIETY BULLETIN | 1991年 / 70卷 / 06期
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暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
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页码：1017 / 1023
页数：7
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