SCANNING PROBE MICROSCOPY OF DIFFRACTION GRATINGS INDUCED BY LASER-RADIATION

[1] THE ACTION OF POWERFUL LASER-RADIATION ON SURFACES OF SEMICONDUCTORS AND METALS - NONLINEAR OPTICAL EFFECTS AND NONLINEAR OPTICAL DIAGNOSTICS [J]. USPEKHI FIZICHESKIKH NAUK, 1985, 147 (04): : 675 - 745

[2] IMAGING AN OPTICAL DISK BY THE COMBINED USE OF SCANNING TUNNELLING MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 205 - 211

[3] BONCHBRUEVICH AM, 1982, IZV AN SSSR FIZ+, V46, P1186

[4] BUKHARAEV AA, 1994, POVERKHNOST, P69

[5] BUKHARAEV AA, 1986, FIZIKA KHIMIYA STEKL, V12, P376

[6] BUKHARAEV AA, 1993, POVERKHNOST, P104

[7] BUKHARAEV AA, 1991, FIZ TVERD TELA, V33, P1018

[8] DENSITY OF AMORPHOUS SI [J]. APPLIED PHYSICS LETTERS, 1994, 64 (04) : 437 - 439

[9] IMAGING OF LASER GENERATED SURFACE RIPPLES ON SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 401 - 403

[10] LASER-INDUCED SUB-HALF-MICROMETER PERIODIC STRUCTURE ON POLYMER SURFACES [J]. APPLIED PHYSICS LETTERS, 1994, 64 (05) : 563 - 565

[1] THE ACTION OF POWERFUL LASER-RADIATION ON SURFACES OF SEMICONDUCTORS AND METALS - NONLINEAR OPTICAL EFFECTS AND NONLINEAR OPTICAL DIAGNOSTICS [J]. USPEKHI FIZICHESKIKH NAUK, 1985, 147 (04): : 675 - 745

[2] IMAGING AN OPTICAL DISK BY THE COMBINED USE OF SCANNING TUNNELLING MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 205 - 211

[3] BONCHBRUEVICH AM, 1982, IZV AN SSSR FIZ+, V46, P1186

[4] BUKHARAEV AA, 1994, POVERKHNOST, P69

[5] BUKHARAEV AA, 1986, FIZIKA KHIMIYA STEKL, V12, P376

[6] BUKHARAEV AA, 1993, POVERKHNOST, P104

[7] BUKHARAEV AA, 1991, FIZ TVERD TELA, V33, P1018

[8] DENSITY OF AMORPHOUS SI [J]. APPLIED PHYSICS LETTERS, 1994, 64 (04) : 437 - 439

[9] IMAGING OF LASER GENERATED SURFACE RIPPLES ON SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 401 - 403

[10] LASER-INDUCED SUB-HALF-MICROMETER PERIODIC STRUCTURE ON POLYMER SURFACES [J]. APPLIED PHYSICS LETTERS, 1994, 64 (05) : 563 - 565