TIME-RESOLVED PHOTOLUMINESCENCE OF ALPHA-CENTERS IN NEUTRON-IRRADIATED SIO2

被引：24

作者：

ANEDDA, A ^{[1
]}

CONGIU, F ^{[1
]}

RAGA, F ^{[1
]}

CORAZZA, A ^{[1
]}

MARTINI, M ^{[1
]}

SPINOLO, G ^{[1
]}

VEDDA, A ^{[1
]}

机构：

[1] UNIV MILAN,DIPARTIMENTO FIS,I-20133 MILAN,ITALY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 91卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(94)96257-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Photoluminescence in various types of silica (a-SiO2) both unirradiated and neutron irradiated has been studied in the range 10-300 K. The already reported alpha emissions at 4.25 eV and at 4.35 eV, whose respective excitation bands peak at 5.10 eV and 4.96 eV, have been found to be excited also in a band peaking at approximately 7.6 eV; the temperature dependence of their intensities has also been investigated for both, excitations. Time resolved emission spectroscopy excited by KrF excimer laser (5 eV) allowed the detection of the different lifetimes of the two a emissions. Similar studies on neutron irradiated quartz (c-SiO2) have evidenced the presence of the center emitting at 4.35 eV up to now observed only in a-SiO2.

引用

页码：405 / 409

页数：5

共 7 条

[1]

CORAZZA A, IN PRESS

[2]

CORAZZA A, 1993, THESIS MILAN U

[3]

GEE CM, 1980, PHYSICS MOS INSULATO, P132

[4]

GUZZIO M, IN PRESS J PHYS COND

[5] PHOTOLUMINESCENCE FROM DEFECT CENTERS IN HIGH-PURITY SILICA GLASSES OBSERVED UNDER 7.9-EV EXCITATION [J].

NISHIKAWA, H ;

SHIROYAMA, T ;

NAKAMURA, R ;

OHKI, Y ;

NAGASAWA, K ;

HAMA, Y .

PHYSICAL REVIEW B, 1992, 45 (02) :586-591

[6] INTRINSIC AND IMPURITY-RELATED POINT-DEFECTS IN AMORPHOUS SILICA - A SPECTROSCOPIC STUDY [J].

PIO, F ;

GUZZI, M ;

SPINOLO, G ;

MARTINI, M .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1990, 159 (02) :577-588

[7] CORRELATION OF THE 5.0-EV AND 7.6-EV ABSORPTION-BANDS IN SIO2 WITH OXYGEN VACANCY [J].

TOHMON, R ;

MIZUNO, H ;

OHKI, Y ;

SASAGANE, K ;

NAGASAWA, K ;

HAMA, Y .

PHYSICAL REVIEW B, 1989, 39 (02) :1337-1345

← 1 →