ELECTRON-TRAP GENERATION BY RECOMBINATION OF ELECTRONS AND HOLES IN SIO2

被引：108

|

作者：

CHEN, IC

HOLLAND, S

HU, C

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 09期

关键词：

D O I：

10.1063/1.338388

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：4544 / 4548

页数：5

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