ELECTRON-TRAP GENERATION BY RECOMBINATION OF ELECTRONS AND HOLES IN SIO2

被引：108
|
作者：
CHEN, IC
HOLLAND, S
HU, C
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 09期
关键词：
D O I：
10.1063/1.338388
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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收藏
页码：4544 / 4548
页数：5
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