EMBEDDED TOTALLY SELF-CHECKING CHECKERS - A PRACTICAL DESIGN

被引：19
|
作者：
KUNDU, S [1 ]
REDDY, SM [1 ]
机构：
[1] UNIV IOWA,IOWA CITY,IA 52242
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1990年 / 7卷 / 04期
关键词：
Codes; Symbolic--Error Detection - Computer Systems; Digital--Fault Tolerant Capability - Electronic Circuits; Flip Flop - Logic Circuits; Combinatorial;
D O I：
10.1109/54.57909
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：5 / 12
页数：8
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