EMBEDDED TOTALLY SELF-CHECKING CHECKERS - A PRACTICAL DESIGN

被引：19

作者：

KUNDU, S ^{[1
]}

REDDY, SM ^{[1
]}

机构：

[1] UNIV IOWA,IOWA CITY,IA 52242

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1990年 / 7卷 / 04期

关键词：

Codes; Symbolic--Error Detection - Computer Systems; Digital--Fault Tolerant Capability - Electronic Circuits; Flip Flop - Logic Circuits; Combinatorial;

D O I：

10.1109/54.57909

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：5 / 12

页数：8

共 50 条

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