DEPTH PROFILING OF LOW-ENERGY IMPLANTED IONS USING FIELD-ION AND ELECTRON-MICROSCOPY TECHNIQUES

被引：0
|
作者：
WALCK, SD [1 ]
机构：
[1] UNIV ALABAMA,DEPT MAT ENGN,UNIV STN,BIRMINGHAM,AL 35294
来源：
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1987年 / 6卷 / 03期
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D O I：
暂无
中图分类号：
Q [生物科学];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
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页码：313 / 313
页数：1
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