BAND OFFSETS FOR STRAINED INXGA1-XAS/ALYGA1-Y AS HETEROINTERFACES

被引:33
作者
ARENT, DJ
机构
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 14期
关键词
D O I
10.1103/PhysRevB.41.9843
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Valence-band offsets for pseudomorphically strained InxGa1-xAs/AlyGa1-yAs ternary-on-ternary heterointerfaces have been calculated as a function of both indium and aluminum content. The unstrained valence-band offsets were considered within the virtual-crystal approximation, accounting for band parabolicity and alloy mixing. Strain was introduced as a perturbation with composition-dependent material parameters, and is shown to strongly influence the valence-band offsets. Equivalent conduction-band-offset ratios are shown to be nonconstant and extremely variable as a function of both In and Al content and are compared to recent experimental data. Various formalisms to calculate the partitioning coefficient for hydrostatic band-gap deformation are presented and discussed, and our analysis indicates that a significant portion of the band-gap variation induced by hydrostatic strain resides in the valence band. Investigation of the spin-split light-hole band level under strain indicates that both type-I and type-II heterointerfaces are achievable with an appropriate choice of compositions. © 1990 The American Physical Society.
引用
收藏
页码:9843 / 9849
页数:7
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