DIFFRACTION ANALYSIS OF ROUGH REFLECTIVE SURFACES

被引：19

作者：

ALLARDYCE, KJ ^{[1
]}

GEORGE, N ^{[1
]}

机构：

[1] UNIV ROCHESTER, INST OPT, ROCHESTER, NY 14627 USA

来源：

APPLIED OPTICS | 1987年 / 26卷 / 12期

关键词：

D O I：

10.1364/AO.26.002364

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2364 / 2375

页数：12

共 21 条

[1] ALLARDYCE KJ, 1985, THESIS U ROCHESTER
[2] BECKMANN P, 1963, SCATTERING ELECTROMA, P9
[3] MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER
BENNETT, JM
[J]. APPLIED OPTICS, 1976, 15 (11): : 2705 - 2721
[4] OPTICAL AND MECHANICAL RMS SURFACE ROUGHNESS COMPARISON
BIRKEBAK, RC
[J]. APPLIED OPTICS, 1971, 10 (08): : 1970 - &
[5] Brigham E. O., 1974, FAST FOURIER TRANSFO
[6] RELATIONSHIP BETWEEN SURFACE SCATTERING AND MICROTOPOGRAPHIC FEATURES
CHURCH, EL
JENKINSON, HA
ZAVADA, JM
[J]. OPTICAL ENGINEERING, 1979, 18 (02) : 125 - 136
[7] MEASUREMENT OF FINISH OF DIAMOND-TURNED METAL-SURFACES BY DIFFERENTIAL LIGHT-SCATTERING
CHURCH, EL
JENKINSON, HA
ZAVADA, JM
[J]. OPTICAL ENGINEERING, 1977, 16 (04) : 360 - 374
[8] SPACE AND WAVELENGTH DEPENDENCE OF SPECKLE INTENSITY
GEORGE, N
JAIN, A
[J]. APPLIED PHYSICS, 1974, 4 (03): : 201 - 212
[9] GOODMAN JW, 1968, INTRO FOURIER OPTICS, pCH5
[10] SURFACE-ROUGHNESS MEASUREMENT WITH SPECKLE INTENSITY DISTRIBUTION DETECTED USING A LINEAR IMAGE-SENSOR
HORIUCHI, T
TOMITA, Y
KAMMEL, R
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (12): : L743 - L745