REFLECTION-RESONANCE-TYPE PHOTON SCANNING TUNNELING MICROSCOPE

被引：4

作者：

JIANG, SD ^{[1
]}

NAKAGAWA, K ^{[1
]}

OHTSU, M ^{[1
]}

机构：

[1] KANAGAWA ACAD SCI & TECHNOL,TAKATSU KU,KAWASAKI 213,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1994年 / 33卷 / 1A期

关键词：

OPTICAL MICROSCOPE; REFLECTION RESONANCE; NEAR FIELD; PHOTON TUNNELING; FREQUENCY SHIFTS; CAVITY; SUBWAVELENGTH LATERAL RESOLUTION;

D O I：

10.1143/JJAP.33.L55

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A novel reflection-resonance-type photon scanning tunneling microscope is proposed to measure the sub-wavelength sample profile by detecting the resonant frequency shifts of a probe cavity. Simulation experiments were carried out to confirm the effectiveness of the present proposal and the theoretical estimation shows that the shot-noise-limited lateral resolution as high as 2.3 X 10(-3) lambda can be expected.

引用

页码：L55 / L58

页数：4

共 13 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].

ASH, EA ;

NICHOLLS, G .

NATURE, 1972, 237 (5357) :510-&

[2] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].

BETZIG, E ;

TRAUTMAN, JK ;

HARRIS, TD ;

WEINER, JS ;

KOSTELAK, RL .

SCIENCE, 1991, 251 (5000) :1468-1470

[3]

BRYNGDAHL O, 1973, PROGR OPTICS, V11, P169

[4]

COURJON D, 1990, APPL OPTICS, V29, P3741

[5]

DURIG U, 1986, J APPL PHYS, V59, P3381

[6] SCANNING ELECTROMAGNETIC TRANSMISSION-LINE MICROSCOPE WITH SUB-WAVELENGTH RESOLUTION [J].

FEE, M ;

CHU, S ;

HANSCH, TW .

OPTICS COMMUNICATIONS, 1989, 69 (3-4) :219-224

[7]

GOODMAN JW, 1968, INTRO FOURIER OPTICS, pCH2

[8] NANOMETRIC SCALE BIOSAMPLE OBSERVATION USING A PHOTON SCANNING TUNNELING MICROSCOPE [J].

JIANG, S ;

OHSAWA, H ;

YAMADA, K ;

PANGARIBUAN, T ;

OHTSU, M ;

IMAI, K ;

IKAI, A .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (07) :2282-2287

[9]

JIANG S, 1991, P CLEO 91 WASHINGTON, P420

[10]

JIANG S, 1990, OEC 90 MAKUHARI MESS

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