CHARGE COLLECTION IN SILICON STRIP DETECTORS

被引:15
作者
KRANER, HW [1 ]
BEUTTENMULLER, R [1 ]
LUDLAM, T [1 ]
HANSON, AL [1 ]
JONES, KW [1 ]
RADEKA, V [1 ]
HEIJNE, EHM [1 ]
机构
[1] CERN, CH-1211 GENEVA 23, SWITZERLAND
关键词
D O I
10.1109/TNS.1983.4332300
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:405 / 414
页数:10
相关论文
共 20 条
[1]   A MULTI-ELECTRODE SILICON DETECTOR FOR HIGH-ENERGY EXPERIMENTS [J].
AMENDOLIA, SR ;
BATIGNANI, G ;
BEDESCHI, F ;
BERTOLUCCI, E ;
BOSISIO, L ;
BRADASCHIA, C ;
BUDINICH, M ;
FIDECARO, F ;
FOA, L ;
FOCARDI, E ;
GIAZOTTO, A ;
GIORGI, MA ;
GIVOLETTI, M ;
MARROCCHESI, PS ;
MENZIONE, A ;
PASSUELLO, D ;
QUAGLIA, M ;
RISTORI, L ;
ROLANDI, L ;
SALVADORI, P ;
SCRIBANO, A ;
STANGA, R ;
STEFANINI, A ;
VINCELLI, ML .
NUCLEAR INSTRUMENTS & METHODS, 1980, 176 (03) :457-460
[2]   MULTI ELECTRODE SEMICONDUCTOR-DETECTORS [J].
AMENDOLIA, SR ;
BATIGNANI, G ;
BERTOLUCCI, E ;
BOSISIO, L ;
BUDINICH, M ;
BRADASCHIA, C ;
FIDECARO, F ;
FOA, L ;
FOCARDI, E ;
GIAZOTTO, A ;
GIORGI, MA ;
MARROCCHESI, PS ;
MENZIONE, A ;
RISTORI, L ;
ROLANDI, L ;
SCRIBANO, A ;
STEFANINI, A ;
VINCELLI, ML .
PHYSICA SCRIPTA, 1981, 23 (04) :674-676
[3]  
BELAU E, 1982, MPIPAEEXPE1104
[4]   PROTON MICROPROBE - POWERFUL TOOL FOR NONDESTRUCTIVE TRACE-ELEMENT ANALYSIS [J].
BOSCH, F ;
GORESY, AE ;
MARTIN, B ;
POVH, B ;
NOBILING, R ;
SCHWALM, D ;
TRAXEL, K .
SCIENCE, 1978, 199 (4330) :765-768
[5]   THE USE OF THE PIXE TECHNIQUE WITH NUCLEAR MICROPROBES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :115-124
[6]   PRODUCTION AND USE OF A NUCLEAR MICROPROBE OF IONS AT MEV ENERGIES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03) :477-508
[7]   A SILICON STRIP DETECTOR WITH 12-MU-M RESOLUTION [J].
ENGLAND, JBA ;
HYAMS, BD ;
HUBBELING, L ;
VERMEULEN, JC ;
WEILHAMMER, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 196 (01) :149-151
[8]  
ENGLAND JBA, 1980, CERNEP80219
[9]  
FERBEL T, 1981, OCT P WORKSH FERM
[10]  
FOX RJ, 1962, IRE T NUCL SCI, VNS9, P213