LOCAL MAGNETORESISTIVE RESPONSE IN THIN-FILM NI-FE READ ELEMENTS - A SUB-MICROMETER-RESOLUTION MEASUREMENT SYSTEM

被引：8

作者：

CROSS, RW ^{[1
]}

KOS, AB ^{[1
]}

THOMPSON, CA ^{[1
]}

PETERSEN, TW ^{[1
]}

机构：

[1] HEWLETT PACKARD CO,DEPT THIN FILM,PALO ALTO,CA 94304

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 05期

关键词：

Barkhausen noise - Four-probe resistance measurement - Magnetic read heads - Magnetoresistive response - Thin-film read elements;

D O I：

10.1109/20.179716

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Bulk and local magnetoresistive responses in Ni-Fe thin films were measured as a function of applied magnetic field and field angle. The measurements were made using a four-probe resistance measurement system, which consisted of two scanning micro-probes for voltage taps, each less than 1-mu-m in tip diameter. The scanning resolution of the micro-probes was 0.5-mu-m. The system was used to determine domain formation and motion in magnetoresistive read heads. Longitudinal fields, produced by demagnetizing or external field components, may cause domain formation and subsequent domain-wall motion (and annihilation). This leads to Barkhausen noise, which is detrimental to the performance of the device as a magnetic read head. Experimental results for both the bulk and local responses were in qualitative agreement with micromagnetic theory.

引用

页码：3060 / 3065

页数：6

共 12 条

[1] EFFECT OF SENSE CURRENT ON BARKHAUSEN NOISE IN MAGNETORESISTIVE RECORDING-HEADS [J].