未找到相关数据
QUALITY ENGINEERING (TAGUCHI METHODS) FOR THE DEVELOPMENT OF ELECTRONIC CIRCUIT-TECHNOLOGY
被引：144
作者：
TAGUCHI, G
机构：
[1] Ohken Associate, Tokyo
[2] General Motors Corporation, Warren
关键词：
TAGUCHI PARADIGM;
FUNCTIONAL ROBUSTNESS;
OBJECTIVE FUNCTION;
BASIC FUNCTION;
TECHNOLOGY DEVELOPMENT;
ROBUST TECHNOLOGY;
PARAMETER DESIGN;
S/N RATIO;
SENSITIVITY;
NOISE FACTOR;
CONTROL FACTOR;
SIGNAL FACTOR;
LABEL FACTOR;
D O I：
10.1109/24.387375
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Most technology development engineers use traditional reliability engineering methods to calibrate the objective functions of their new systems to meet various marketing requirements. These methods are marginally effective in reducing failure rates. To fundamentally improve quality, the engineers need to focus on improving the robustness bf the basic functions of their new product or process technologies and apply parameter design methods to make the basic functions approach the ideal functions under real conditions. These robust design activities should be conducted by research and development departments before actual products are planned. The objective is to improve the downstream reproducibility of new technologies. The technical development of an electronic circuit is used to explain this proposition.
引用
收藏
页码：225 / 229
页数：5
相关论文