CHARACTERIZATION OF ALUMINUM/LPCVD POLYSILICON SCHOTTKY-BARRIER DIODES

被引：1
作者：
CHEN, DL [1 ]
GREVE, DW [1 ]
GUZMAN, AM [1 ]
机构：
[1] CARNEGIE MELLON UNIV,MELLON INST,PITTSBURGH,PA 15213
来源：
SOLID-STATE ELECTRONICS | 1987年 / 30卷 / 03期
关键词：
D O I：
10.1016/0038-1101(87)90192-4
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：339 / 343
页数：5
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