THE APPLICATION OF NEUTRON AND X-RAY REFLECTION TO THE STUDY OF THE STRUCTURE OF INTERFACES

被引：0
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作者：
HUGHESDAVIES, TT
LEE, EM
WILLATT, AJ
THOMAS, RK
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 101期
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：171 / 179
页数：9
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