BEAM CURRENT STABILITY FROM LOCALIZED EMISSION SITES IN A FIELD-ION SOURCE

被引：21

作者：

SCHWOEBEL, PR ^{[1
]}

HANSON, GR ^{[1
]}

机构：

[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 01期

关键词：

D O I：

10.1116/1.583230

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：214 / 219

页数：6

共 15 条

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[8] FIELD IONIZATION FROM H2 LAYERS
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