UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS

被引：52

作者：

CAMPBELL, JL ^{[1
]}

COOKSON, JA ^{[1
]}

PAUL, H ^{[1
]}

机构：

[1] JOHANNES KEPLER UNIV,INST EXPTL PHYS,A-4040 LINZ,AUSTRIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 212卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)90725-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：427 / 439

页数：13

共 32 条

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[9] PROTON-INDUCED X-RAY-EMISSION (PIXE) ANALYSIS ON THICK SAMPLES EXEMPLIFIED ON THE RARE-EARTH ELEMENTS .1. EXPERIMENTAL-DETERMINATION OF CALIBRATION CURVES, PRECISION, AND MATRIX EFFECTS [J].

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[10] A SEMI-EMPIRICAL PROCEDURE FOR THE SIMPLE CALCULATION OF THE SIGNAL INTENSITY IN PIXE ANALYSIS OF THICK SAMPLES [J].

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