SOME INVESTIGATIONS INTO OPTICAL PROBE TESTING OF INTEGRATED-CIRCUITS

被引：3

作者：

EDWARDS, WD

SMITH, JG

KEMHADJIAN, HA

机构：

[1] UNIV SOUTHAMPTON, SOUTHAMPTON, ENGLAND

[2] UNIV SOUTHAMPTON, DEPT ELECTR, SOUTHAMPTON SO9 5NH, ENGLAND

来源：

RADIO AND ELECTRONIC ENGINEER | 1976年 / 46卷 / 01期

关键词：

D O I：

10.1049/ree.1976.0005

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：35 / 41

页数：7

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