SOME INVESTIGATIONS INTO OPTICAL PROBE TESTING OF INTEGRATED-CIRCUITS

被引：3

作者：

EDWARDS, WD

SMITH, JG

KEMHADJIAN, HA

机构：

[1] UNIV SOUTHAMPTON, SOUTHAMPTON, ENGLAND

[2] UNIV SOUTHAMPTON, DEPT ELECTR, SOUTHAMPTON SO9 5NH, ENGLAND

来源：

RADIO AND ELECTRONIC ENGINEER | 1976年 / 46卷 / 01期

关键词：

D O I：

10.1049/ree.1976.0005

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：35 / 41

页数：7

共 12 条

[1] FAULT DIAGNOSIS OF DIGITAL SYSTEMS - REVIEW [J].

BENNETTS, RG ;

LEWIN, DW .

COMPUTER JOURNAL, 1971, 14 (02) :199-+

[2] NONDESTRUCTIVE PHOTOVOLTAIC TECHNIQUE FOR MEASUREMENT OF RESISTIVITY GRADIENTS IN CIRCULAR SEMICONDUCTOR WAFERS [J].

BLACKBURN, DL ;

SCHAFFT, HA ;

SWARTZENDRUBER, LJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (12) :1773-+

[3] BARRIER INHOMOGENEITIES ON A SI-SIO2 INTERFACE BY SCANNING INTERNAL PHOTOEMISSION [J].

DISTEFAN.TH .

APPLIED PHYSICS LETTERS, 1971, 19 (08) :280-&

[4]

GUPTA DC, 1971, SOLID STATE TECHNOL, V14, P44

[5]

HABERER JR, 1968, PHYS FAIL ELECTRON, V5, P51

[6]

HUNTER DR, 1973, SCANNING ELECTRON MI, P208

[7]

Iles P.A., 1962, IRE T MIL ELECT, VMIL-6, P5, DOI [10.1109/iret-mil.1962.5008391, DOI 10.1109/IRET-MIL.1962.5008391]

[8]

MCMAHON RE, 1971, ELECTRONICS, V44, P92

[9]

POTTER CN, 1968, PHYS FAIL ELECTRON, V5, P37

[10] DIAGNOSTICS FOR LOGIC NETWORKS [J].

SUSSKIND, AK .

IEEE SPECTRUM, 1973, 10 (10) :40-47

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