ATOM-PROBE FIELD-ION MICROSCOPY AND APPLICATIONS TO SURFACE SCIENCE

Atom-probe field ion microscopy is capable of imaging solid surfaces with atomic resolution, and at the same time chemically analyzing atoms selected by the observer from the atomic image. While the samples have to be restricted to those having a tip shape, this is becoming an advantage in many applications where a high electric field is needed. Its early developments and recent applications to surface science are briefly described here.