FUNCTIONAL TEST-GENERATION USING BINARY DECISION DIAGRAMS

被引：1

作者：

ABADIR, MS ^{[1
]}

REGHBATI, HK ^{[1
]}

机构：

[1] SIMON FRASER UNIV,SCH COMP SCI,BURNABY V5A 1S6,BC,CANADA

来源：

关键词：

D O I：

10.1016/0898-1221(87)90072-1

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

引用

页码：413 / 430

页数：18

共 18 条

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Abadir, Magdy S.
Reghbati, Hassan K.
[J]. IEEE Transactions on Computers, 1986, C-35 (04) : 375 - 379
[2] FUNCTIONAL SPECIFICATION AND TESTING OF LOGIC-CIRCUITS
ABADIR, MS
REGHBATI, HK
[J]. COMPUTERS & MATHEMATICS WITH APPLICATIONS, 1985, 11 (12) : 1143 - 1153
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[8] BREUER MA, 1980, IEEE T COMPUT, V29, P223, DOI 10.1109/TC.1980.1675554
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