STOCHASTIC MODELING OF ELECTRICAL TREEING - FRACTAL AND STATISTICAL CHARACTERISTICS

被引:77
作者
BARCLAY, AL [1 ]
SWEENEY, PJ [1 ]
DISSADO, LA [1 ]
STEVENS, GC [1 ]
机构
[1] UNIV LONDON KINGS COLL,DEPT PHYS,LONDON WC2R 2LS,ENGLAND
关键词
D O I
10.1088/0022-3727/23/12/009
中图分类号
O59 [应用物理学];
学科分类号
摘要
A two-dimensional stochastic model of electrical treeing in solid dielectrics has been examined using ’fractal ’ analysis and statistical methods. It is found that simulated trees display remarkably similar behaviour to that found experimentally. A distribution of dimensions is found and simulated failure probability is well described by the two-parameter Weibull distribution. Several methods of assessing fractal dimension are critically compared and correlations are found between different methods. The influence of model parameters on tree growth behaviour is also examined. © 1990 IOP Publishing Ltd.
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页码:1536 / 1545
页数:10
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