STOCHASTIC MODELING OF ELECTRICAL TREEING - FRACTAL AND STATISTICAL CHARACTERISTICS

被引：78

作者：

BARCLAY, AL ^{[1
]}

SWEENEY, PJ ^{[1
]}

DISSADO, LA ^{[1
]}

STEVENS, GC ^{[1
]}

机构：

[1] UNIV LONDON KINGS COLL,DEPT PHYS,LONDON WC2R 2LS,ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1990年 / 23卷 / 12期

关键词：

D O I：

10.1088/0022-3727/23/12/009

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A two-dimensional stochastic model of electrical treeing in solid dielectrics has been examined using ’fractal ’ analysis and statistical methods. It is found that simulated trees display remarkably similar behaviour to that found experimentally. A distribution of dimensions is found and simulated failure probability is well described by the two-parameter Weibull distribution. Several methods of assessing fractal dimension are critically compared and correlations are found between different methods. The influence of model parameters on tree growth behaviour is also examined. © 1990 IOP Publishing Ltd.

引用

页码：1536 / 1545

页数：10

共 13 条

[1] THE INFLUENCE OF PHYSICAL-PROPERTIES ON ELECTRICAL TREEING IN A CROSS-LINKED SYNTHETIC RESIN [J].

COOPER, JM ;

STEVENS, GC .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1528-1535

[2] INVESTIGATION INTO THE GROWTH OF ELECTRICAL TREES IN XLPE CABLE INSULATION [J].

DENSLEY, RJ .

IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1979, 14 (03) :148-158

[3] THEORETICAL BASIS FOR THE STATISTICS OF DIELECTRIC-BREAKDOWN [J].

DISSADO, LA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1582-1591

[4]

DISSADO LA, 1989, 3 ICSD TRONDH NORW J, P528

[5]

HOZUMI N, 1987, C ELECTRICAL INSULAT, P531

[6]

HOZUMI N, 1989, 3RD P INT C SOL DIEL, P543

[7] CONSTRUCTION OF TOLERANCE BOUNDS FOR EXTREME-VALUE AND WEIBULL DISTRIBUTIONS [J].

LAWLESS, JF .

TECHNOMETRICS, 1975, 17 (02) :255-261

[8] CONFIDENCE-INTERVAL ESTIMATION FOR WEIBULL AND EXTREME VALUE DISTRIBUTIONS [J].

LAWLESS, JF .

TECHNOMETRICS, 1978, 20 (04) :355-364

[9]

Mandelbrot B. B., 1982, FRACTAL GEOMETRY NAT, P1

[10] FRACTAL DIMENSION OF DIELECTRIC-BREAKDOWN [J].

NIEMEYER, L ;

PIETRONERO, L ;

WIESMANN, HJ .

PHYSICAL REVIEW LETTERS, 1984, 52 (12) :1033-1036

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