OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE

被引：149

作者：

DURIG, U

ZUGER, O

POHL, DW

机构：

[1] IBM Research Division, Zurich Research Laboratory

来源：

PHYSICAL REVIEW LETTERS | 1990年 / 65卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.65.349

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The interaction between an Ir tip and an Ir sample was investigated during normal tunneling operation of the scanning tunneling microscope. Force gradients compatible with metallic adhesion were observed within a range of 2 before making contact. Based on the theory of metallic adhesion, a scaling relation is derived which allows the tip geometry and the characteristics of the interaction to be accounted for in a systematic manner. © 1990 The American Physical Society.

引用

页码：349 / 352

页数：4

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