PHOTOREFRACTIVE MEASUREMENTS ON ELECTRON-IRRADIATED SEMIINSULATING GAAS

被引:4
|
作者
DELAYE, P
VONBARDELEBEN, HJ
ROOSEN, G
机构
[1] UNIV PARIS 06,PHYS SOLIDE GRP,CNRS,URA 17,F-75005 PARIS,FRANCE
[2] UNIV PARIS 07,PHYS SOLIDE GRP,CNRS,URA 17,F-75221 PARIS 05,FRANCE
来源
关键词
D O I
10.1007/BF00331712
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present photorefractive measurements at 1.06 mum and 1.3 mum performed in electron-irradiated GaAs. Irradiation with electrons of kinetic energies greater-than-or-equal-to 1 MeV introduces intrinsic electrically active defects which modify the Fermi-level position and allow to modify the electron-hole competition mechanism of the photorefractive effect. Furthermore, it is shown that the optical absorption in the 1.3-1.5 mum spectral range can be increased, which might allow to enlarge the useful spectral range of GaAs towards optical telecommunication windows. The native and irradiation-induced defects are assessed by electron paramagnetic resonance and optical absorption spectroscopy conducted at T = 300 K and 77 K. The direct influence of an irradiation-induced mid-gap defect on the photorefractive effect is experimentally and theoretically demonstrated.
引用
收藏
页码:357 / 364
页数:8
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