OPTIMAL REPAIR STAGE FOR K-OUT-OF-N SYSTEMS

被引：2

|

作者：

VENUGOPAL, N

AHAMED, SS

REDDY, CR

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1989年 / 29卷 / 01期

关键词：

D O I：

10.1016/0026-2714(89)90005-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：17 / 19

页数：3

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