TRACE ANALYSIS OF HIGH-PURITY IRON BY TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

被引：20
作者：
CHEN, JS
BERNDT, H
KLOCKENKAMPER, R
TOLG, G
机构：
[1] INST SPEKTROCHEM & ANGEW SPEKT,W-4600 DORTMUND 1,GERMANY
[2] MAX PLANCK INST MET RES,REINSTSTOFFANALYT LAB,W-4600 DORTMUND 1,GERMANY
来源：
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1990年 / 338卷 / 08期
关键词：
D O I：
10.1007/BF00322026
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A combined procedure enabling simultaneous multielement analysis of trace impurities in high-purity iron is presented. After removal of the iron matrix by solvent extraction with methyl isobutyl ketone, the trace elements Ti, V, Cr, Mn, Ni, Cu, Pb and Bi are determined by means of total reflection X-ray fluorescence analysis. Detection limits are found in the range of 100 ng/g. The reliability of the method is verified by the analysis of commercial high-purity iron and by the comparison of analytical data obtained by ICP-AES.
引用
收藏
页码：891 / 894
页数：4
相关论文
共 13 条
12