INVESTIGATION OF STRUCTURE OF THIN FILMS OF LOW-TEMPERATURE PYROLYTIC GRAPHITE BY ELECTRON DIFFRACTION

被引：0

作者：

KURDYUMOV, AV

PILYANKE.AN

GNESIN, GG

机构：

来源：

SOVIET PHYSICS CRYSTALLOGRAPHY, USSR | 1967年 / 11卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：739 / +

页数：1

共 8 条

[1] THE MEASUREMENT OF THE THICKNESS OF THIN CARBON FILMS
AGAR, AW
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (01): : 35 - 36
[2] THE ALPHA DIMENSION OF GRAPHITE
BACON, GE
FRANKLIN, RE
[J]. ACTA CRYSTALLOGRAPHICA, 1951, 4 (06): : 561 - 562
[3] CRYSTALLITE GROWTH IN GRAPHITIZING AND NON-GRAPHITIZING CARBONS
FRANKLIN, RE
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 209 (1097): : 196 - &
[4] X-RAY STUDY OF PYROLYTIC GRAPHITES
GUENTERT, OJ
[J]. JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) : 884 - &
[5] KURDYUMOV AV, 1966, POROSHKOV METALL, V2, P87
[6] KURDYUMOV AV, 1966, KRISTALLOGRAFIYA, V11, P866
[7] Tesner P. A., 1952, DOKL AKAD NAUK SSSR, V87, P821
[8] X-ray diffraction in random layer lattices
Warren, BE
[J]. PHYSICAL REVIEW, 1941, 59 (09): : 693 - 698