SPECIMEN DAMAGE BY NUCLEAR MICROBEAMS AND ITS AVOIDANCE

被引：61
作者：
COOKSON, JA
机构：
[1] Harwell Lab, Didcot, Engl, Harwell Lab, Didcot, Engl
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 03期
关键词：
ION BEAMS - SPUTTERING;
D O I：
10.1016/0168-583X(88)90020-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
As attempts are made to produce smaller and more intense nuclear microbeams the problems of specimen damage become more important. A summary of current knowledge is given for the damage mechanisms: sputtering, elemental migration, heating and atomic displacement. The effects of changing experimental conditions on the degree of damage are discussed and means of minimizing the effects are described.
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页码：324 / 330
页数：7
相关论文
共 24 条
[1]  
ANDERSEN HH, 1981, TOP APPL PHYS, V47, P145, DOI [10.1007/3540105212_9, DOI 10.1007/3540105212_9]
[2]   THE EROSION OF FROZEN ARGON BY SWIFT HELIUM-IONS [J].
BESENBACHER, F ;
BOTTIGER, J ;
GRAVERSEN, O ;
SORENSEN, H .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :221-234
[3]  
BETZ G, 1983, TOP APPL PHYS, V52, P11
[4]   EROSION AND MOLECULE FORMATION IN CONDENSED GAS FILMS BY ELECTRONIC-ENERGY LOSS OF FAST IONS [J].
BROWN, WL ;
AUGUSTYNIAK, WM ;
SIMMONS, E ;
MARCANTONIO, KJ ;
LANZEROTTI, LJ ;
JOHNSON, RE ;
BORING, JW ;
REIMANN, CT ;
FOTI, G ;
PIRRONELLO, V .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 198 (01) :1-8
[5]   CONTROL OF TEMPERATURE IN THIN SAMPLES DURING ION-BEAM ANALYSIS [J].
CAHILL, TA ;
MCCOLM, DW ;
KUSKO, BH .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 14 (01) :38-44
[6]  
Carslaw It, 1959, CONDUCTION HEAT SOLI
[7]  
CHU WK, 1978, BACKSCATTERING SPECT, P272
[8]   THE USE OF THE PIXE TECHNIQUE WITH NUCLEAR MICROPROBES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :115-124
[9]  
COOTE G, 1983, 3RD P AUST C NUCLEAR, P86
[10]   A RADIATION THERMOMETER FOR TEMPERATURE CONTROL OF THIN SAMPLES DURING PIXE ANALYSIS [J].
GLOYSTEIN, F ;
RICHTER, FW .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 22 (1-3) :45-48
123