INVESTIGATION OF SRRUO3 BARRIERS IN SNS JUNCTIONS

被引：22

作者：

DOMEL, R ^{[1
]}

JIA, CL ^{[1
]}

COPETTI, C ^{[1
]}

OCKENFUSS, G ^{[1
]}

BRAGINSKI, AI ^{[1
]}

机构：

[1] KFA JULICH,FORSCHUNGSZENTRUM JULICH,INST FESTKORPERFORSCH,D-52425 JULICH,GERMANY

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1994年 / 7卷 / 05期

关键词：

D O I：

10.1088/0953-2048/7/5/012

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High-quality films and multilayers of SrRuO3 and YBa2Cu3O7 (YBCO) have been grown by off-axis sputtering. High-resolution transmission electron microscopy proved that the interface is atomically sharp. SNS junctions with SrRuO3 barriers have been fabricated ex situ in an edge geometry, and in a sandwich geometry with both interfaces grown in situ. Supercurrents have been observed with barrier thicknesses from 10 to 40 nm, and Shapiro steps could be detected. In both junction geometries the normal resistance is several orders of magnitude higher, as would be expected from the resistance of the SrRuO film, and shows a non-metallic temperature dependence. An exponential dependence of the normal resistance upon the barrier thickness has been observed.

引用

页码：277 / 280

页数：4